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1999 (1)
1997 (1)
1Author    H.-U Finzel, Bi Heping, P. WissmannRequires cookie*
 Title    The Kinetics of Catalytic Reactions Studied by Resistivity Measurements on Thin Metal Films  
 Abstract    Resistivity measurements on thin films are very suitable for the study of the kinetics of reactions on metallic surfaces. The oxidation of carbon monoxide on palladium is investigated as an example of great technical relevance, where details of the reaction mechanism and the film structure are well-known from literature. The time dependence of the change in resistivity is quantitatively interpreted with the help of a diffusion model based on a Monte-Carlo simulation of the gas coverage of the surface. 
  Reference    Z. Naturforsch. 52a, 640—644 (1997); received June 21 1997 
  Published    1997 
  Keywords    Heterogeneous Catalysis, Kinetics, Resistivity, Thin Metal Films 
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 TEI-XML for    default:Reihe_A/52/ZNA-1997-52a-0640.pdf 
 Identifier    ZNA-1997-52a-0640 
 Volume    52 
2Author    M. Rauh, H.-U Finzel, P. WißmannRequires cookie*
 Title    The Oxidation Kinetics of Thin Copper Films Studied by Resistivity Measurements  
 Abstract    Resistivity measurements on thin metal films allow to study the kinetics of oxidation. The method is applied to 50 -60 nm thick copper films deposited on glass substrates under UHV conditions. After annealing at 150 °C, the films are exposed to pure oxygen at various temperatures in the range 85 -135 °C, and the electrical resistivity is recorded in situ. At these temperatures, the oxygen begins to penetrate into the interior of the films, which results in a relatively steep increase in the film resistivity. A linear time law is valid to good approximation, which can be attributed to the influence of the dissociation of an adsorbed molecular species of oxygen on the reaction velocity. A potential diffusion of oxygen in the grain boundaries is also discussed. 
  Reference    Z. Naturforsch. 54a, 117—123 (1999); received July 29 1998 
  Published    1999 
  Keywords    Oxidation, Kinetics, Resistivity, Thin Metal Films 
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 TEI-XML for    default:Reihe_A/54/ZNA-1999-54a-0117.pdf 
 Identifier    ZNA-1999-54a-0117 
 Volume    54