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'Semiconductor breakdown' in keywords Facet   Publication Year 1991  [X]
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1Author    R. Richter, U. Rau, A. Kittel, G. Heinz, J. Peinke, J. Parisi, R. P. HuebenerRequires cookie*
 Abstract    n th e S c a lin g o f T y p e -I I n te r m itte n c y in a S e m ic o n d u c to r E x p e r im e n t Spontaneous oscillations developing during low-temperature impact ionization breakdown in extrinsic germanium are looked at with respect to characteristic features of type-I intermittency. 
  Reference    Z. Naturforsch. 46a, 1012—1014 (1991); received October 4 1991 
  Published    1991 
  Keywords    Semiconductor breakdown, Intermittency, Scaling behavior 
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 TEI-XML for    default:Reihe_A/46/ZNA-1991-46a-1012.pdf 
 Identifier    ZNA-1991-46a-1012 
 Volume    46